Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

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Release : 2015-03-23
Genre : Technology & Engineering
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Book Rating : 302/5 ( reviews)

Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) write by Rolf Erni. This book was released on 2015-03-23. Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) available in PDF, EPUB and Kindle. Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

Liquid Cell Electron Microscopy

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Release : 2017
Genre : Science
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Book Rating : 570/5 ( reviews)

Liquid Cell Electron Microscopy - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Liquid Cell Electron Microscopy write by Frances M. Ross. This book was released on 2017. Liquid Cell Electron Microscopy available in PDF, EPUB and Kindle. 2.6.2 Electrodes for Electrochemistry

Transmission Electron Microscopy

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Release : 2013-11-11
Genre : Science
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Book Rating : 531/5 ( reviews)

Transmission Electron Microscopy - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Transmission Electron Microscopy write by Ludwig Reimer. This book was released on 2013-11-11. Transmission Electron Microscopy available in PDF, EPUB and Kindle. The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.

Advanced Computing in Electron Microscopy

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Release : 2010-08-12
Genre : Science
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Book Rating : 335/5 ( reviews)

Advanced Computing in Electron Microscopy - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Advanced Computing in Electron Microscopy write by Earl J. Kirkland. This book was released on 2010-08-12. Advanced Computing in Electron Microscopy available in PDF, EPUB and Kindle. Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.

Transmission Electron Microscopy

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Release : 2016-08-24
Genre : Technology & Engineering
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Book Rating : 519/5 ( reviews)

Transmission Electron Microscopy - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Transmission Electron Microscopy write by C. Barry Carter. This book was released on 2016-08-24. Transmission Electron Microscopy available in PDF, EPUB and Kindle. This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.