Nanoscale Standards by Metrological AFM and Other Instruments - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Nanoscale Standards by Metrological AFM and Other Instruments write by Ichiko Misumi. This book was released on 2021. Nanoscale Standards by Metrological AFM and Other Instruments available in PDF, EPUB and Kindle.
Nanoscale Calibration Standards and Methods
Nanoscale Calibration Standards and Methods - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Nanoscale Calibration Standards and Methods write by Günter Wilkening. This book was released on 2006-05-12. Nanoscale Calibration Standards and Methods available in PDF, EPUB and Kindle. The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Nanoscale Standards Metrological Afm O
Nanoscale Standards Metrological Afm O - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Nanoscale Standards Metrological Afm O write by MISUMI. This book was released on 2021-07-31. Nanoscale Standards Metrological Afm O available in PDF, EPUB and Kindle.
Nanoscale Standards by Metrological AFM and Other Instruments
Nanoscale Standards by Metrological AFM and Other Instruments - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Nanoscale Standards by Metrological AFM and Other Instruments write by Ichiko Misumi. This book was released on 2021. Nanoscale Standards by Metrological AFM and Other Instruments available in PDF, EPUB and Kindle. The purpose of this book is to help semiconductor inspection equipment users and manufacturers understand what nano dimensional standards are used to calibrate their equipment and how to employ them effectively. Reviewing trends and developments in nanoscale standards, the book starts with an introductory overview of nanometrological standards before proceeding to detail pitch standard, step height, line width, nano particle size, and surface roughness. This book is essential for users making quantitative nanoscale measurements, be that in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications. Here the author provides an approachable understanding and application of the nanoscale standards in a practical context across a range of common nanoscale measurement modalities, including 3D, with particular emphasis on applications to AFM, an exceptional and arguably the most common technique used in nanometrology due to the ease of use and versatility of applications.
Fundamental Principles of Engineering Nanometrology
Fundamental Principles of Engineering Nanometrology - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Fundamental Principles of Engineering Nanometrology write by Richard Leach. This book was released on 2009-09-03. Fundamental Principles of Engineering Nanometrology available in PDF, EPUB and Kindle. Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. - Provides a basic introduction to measurement and instruments - Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force - Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments) - Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) - Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge
