Reliability and Failure of Electronic Materials and Devices

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Release : 2014-10-14
Genre : Technology & Engineering
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Book Rating : 528/5 ( reviews)

Reliability and Failure of Electronic Materials and Devices - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Reliability and Failure of Electronic Materials and Devices write by Milton Ohring. This book was released on 2014-10-14. Reliability and Failure of Electronic Materials and Devices available in PDF, EPUB and Kindle. Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Reliability and Failure of electronic Materials and Devices 2/E

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Release : 2015-04
Genre :
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Book Rating : /5 ( reviews)

Reliability and Failure of electronic Materials and Devices 2/E - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Reliability and Failure of electronic Materials and Devices 2/E write by Milton Ohring. This book was released on 2015-04. Reliability and Failure of electronic Materials and Devices 2/E available in PDF, EPUB and Kindle.

Corrosion and Reliability of Electronic Materials and Devices

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Release : 1999
Genre : Science
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Book Rating : 525/5 ( reviews)

Corrosion and Reliability of Electronic Materials and Devices - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Corrosion and Reliability of Electronic Materials and Devices write by Robert B. Comizzoli. This book was released on 1999. Corrosion and Reliability of Electronic Materials and Devices available in PDF, EPUB and Kindle.

Practical Reliability Of Electronic Equipment And Products

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Release : 2002-10-25
Genre : Technology & Engineering
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Book Rating : 089/5 ( reviews)

Practical Reliability Of Electronic Equipment And Products - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Practical Reliability Of Electronic Equipment And Products write by Eugene R. Hnatek. This book was released on 2002-10-25. Practical Reliability Of Electronic Equipment And Products available in PDF, EPUB and Kindle. Examining numerous examples of highly sensitive products, this book reviews basic reliability mathematics, describes robust design practices, and discusses the process of selecting suppliers and components. He focuses on the specific issues of thermal management, electrostatic discharge, electromagnetic compatibility, printed wiring assembly, environmental stress testing, and failure analysis. The book presents methods for meeting the reliability goals established for the manufacture of electronic product hardware and addresses the development of reliable software. The appendix provides example guidelines for the derating of electrical and electromechanical components.

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

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Release : 2012-09-24
Genre : Technology & Engineering
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Book Rating : 369/5 ( reviews)

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Materials and Reliability Handbook for Semiconductor Optical and Electron Devices write by Osamu Ueda. This book was released on 2012-09-24. Materials and Reliability Handbook for Semiconductor Optical and Electron Devices available in PDF, EPUB and Kindle. Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.