Soft Error Reliability of VLSI Circuits - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Soft Error Reliability of VLSI Circuits write by Behnam Ghavami. This book was released on 2020-10-13. Soft Error Reliability of VLSI Circuits available in PDF, EPUB and Kindle. This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Analysis and Design of Resilient VLSI Circuits
Analysis and Design of Resilient VLSI Circuits - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Analysis and Design of Resilient VLSI Circuits write by Rajesh Garg. This book was released on 2009-10-22. Analysis and Design of Resilient VLSI Circuits available in PDF, EPUB and Kindle. This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Soft Errors in Modern Electronic Systems write by Michael Nicolaidis. This book was released on 2010-09-24. Soft Errors in Modern Electronic Systems available in PDF, EPUB and Kindle. This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Soft Errors
Soft Errors - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Soft Errors write by Jean-Luc Autran. This book was released on 2017-12-19. Soft Errors available in PDF, EPUB and Kindle. Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.
Mitigation of Soft Errors in Nanoscale VLSI Circuits
Mitigation of Soft Errors in Nanoscale VLSI Circuits - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Mitigation of Soft Errors in Nanoscale VLSI Circuits write by Nagarajan Ranganathan. This book was released on 2014-03-28. Mitigation of Soft Errors in Nanoscale VLSI Circuits available in PDF, EPUB and Kindle. Reliability is a key concern in VLSI systems and transient/intermittent faults, often caused by soft errors, require designers to create special mitigation techniques. This book describes such techniques, spanning all levels of the design flow, to reduce systematically the vulnerability of VLSI systems to soft errors. Readers will be enabled to address soft error issues early in their design flow, allowing them to weigh the implications of dedicating more resources for soft error detection and prevention, against the correlating impact on delay, power and area.
