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Release : 1995
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Direct Correlation of Transport Properties and Microstructure in Y1Ba2Cu3O{sub 7-x} Thin Film Grain Boundaries - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Direct Correlation of Transport Properties and Microstructure in Y1Ba2Cu3O{sub 7-x} Thin Film Grain Boundaries write by . This book was released on 1995. Direct Correlation of Transport Properties and Microstructure in Y1Ba2Cu3O{sub 7-x} Thin Film Grain Boundaries available in PDF, EPUB and Kindle. Individual 45° [0011] tilt grain boundaries in Y{sub l}Ba2Cu3O{sub 7-x} thin films grown on biepitaxial substrates were studied. The thin films were grown using both pulsed organometallic beam epitaxy (POMBE) and laser ablation. Transport characteristics of the individual grain boundaries were measured including resistance -- temperature (R-T) and current -- voltage (I-V) dependencies with and without an applied magnetic field. In order to elucidate possible structural origins of the differences in transport behavior, the same grain boundaries which were electrically characterized were subsequently thinned for electron-microscopy analysis. Transmission-electron-microscopy and high-resolution-electron-microscopy were used to structurally characterize the grain boundaries. The macroscopic and microscopic structures of two boundaries, a nominally resistive and a superconducting grain boundary, are compared. Work supported by the National Science Foundation Office of Science and Technology Centers, under contract {number_sign}DMR 91-20000 (BVV, DBB) and the US Department of Energy, Basic Energy Sciences-Materials Science, under contract {number_sign}W-31-109-EN(S-38 (KLM).