VLSI Test Principles and Architectures - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook VLSI Test Principles and Architectures write by Laung-Terng Wang. This book was released on 2006-08-14. VLSI Test Principles and Architectures available in PDF, EPUB and Kindle. This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
VLSI Fault Modeling and Testing Techniques
VLSI Fault Modeling and Testing Techniques - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook VLSI Fault Modeling and Testing Techniques write by George W. Zobrist. This book was released on 1993. VLSI Fault Modeling and Testing Techniques available in PDF, EPUB and Kindle. VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are utilized. Bridging faults are important due to the shrinking geometry of ICs. BIST PLA schemes have common features-controllability and observability - which are enhanced through additional logic and test points. Certain circuit topologies are more easily testable than others. The amount of reconvergent fan-out is a critical factor in determining realistic measures for determining test generation difficulty. Test implementation is usually left until after the VLSI data path has been synthesized into a structural description. This leads to investigation methodologies for performing design synthesis with test incorporation. These topics and more are discussed.
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits write by M. Bushnell. This book was released on 2006-04-11. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits available in PDF, EPUB and Kindle. The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
VLSI Testing
VLSI Testing - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook VLSI Testing write by Stanley Leonard Hurst. This book was released on 1998. VLSI Testing available in PDF, EPUB and Kindle. Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability - read free eBook in online reader or directly download on the web page. Select files or add your book in reader. Download and read online ebook VLSI Design and Test for Systems Dependability write by Shojiro Asai. This book was released on 2018-07-20. VLSI Design and Test for Systems Dependability available in PDF, EPUB and Kindle. This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
